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Much research on software engineering and software testing relies on experimental studies based on fault injection.
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2003
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2005
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2005
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J. Andrews, L. Briand, Y. Labiche, and A. Namin, “Using mutation analysis for assessing and comparing testing coverage criteria,” Software Engineering, IEEE Transactions on , vol. 32, no. 8, pp. 608–624, 2006
2006
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J. H. Andrews, L. C. Briand, Y. Labiche, and A. S. Namin, “Using mutation analysis for assessing and comparing testing coverage criteria,” IEEE Trans. Software Eng. , vol. 32, no. 8, pp. 608–624, 2006. [Online]. Available: https://doi.org/10.1109/TSE.2006.83
2006
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P. Ammann and J. Offutt, Introduction to Software Testing . Cambridge University Press, 2008. [Online]. Available: https://doi.org/10.1017/CBO9780511809163
2008
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R. Abreu, P. Zoeteweij, and A. J. Van Gemund, “Spectrum-based multiple fault localization,” in Proceedings of the 24th IEEE/ACM International Conference on Automated Software Engineering (ASE) , 2009, pp. 88–99
2009
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N. Li, U. Praphamontripong, and J. Offutt, “An experimental comparison of four unit test criteria: Mutation, edge-pair, all-uses and prime path coverage,” in Second International Conference on Software Testing Verification and Validation, ICST, 2009, Workshops Proceedings . IEEE Computer Society, 2009, pp. 220–229. [Online]. Available: https://doi.org/10.1109/ICSTW.2009.30
2009
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W. E. Wong, V. Debroy, and B. Choi, “A family of code coverage-based heuristics for effective fault localization,” Journal of Systems and Software , vol. 83, no. 2, pp. 188–208, 2010
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2010
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R. Natella, D. Cotroneo, J. Durães, and H. Madeira, “On fault representativeness of software fault injection,” IEEE Trans. Software Eng. , vol. 39, no. 1, pp. 80–96, 2013. [Online]. Available: https://doi.org/10.1109/TSE.2011.124
2011
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C. Parnin and A. Orso, “Are automated debugging techniques actually helping programmers?” in Proceedings of the 20th ISSTA . ACM, 2011, pp. 199–209
2011
Cited alongside, same era.
N. Palix, G. Thomas, S. Saha, C. Calvès, J. Lawall, and G. Muller, “Faults in linux: Ten years later,” in Proceedings of the sixteenth international conference on Architectural support for programming languages and operating systems , 2011, pp. 305–318
2011
Cited alongside, same era.
2011
Cited alongside, same era.
J. Zhou, H. Zhang, and D. Lo, “Where should the bugs be fixed? more accurate information retrieval-based bug localization based on bug reports,” in Proceedings of the 2012 International Conference on Software Engineering (ICSE) , 2012, pp. 14–24
D. Gong, G. Zhang, X. Yao, and F. Meng, “Mutant reduction based on dominance relation for weak mutation testing,” Information & Software Technology , vol. 81, pp. 82–96, 2017. [Online]. Available: https://doi.org/10.1016/j.infsof.2016.05.001
2016
Later among the works it cites.
M. Papadakis, C. Henard, M. Harman, Y. Jia, and Y. L. Traon, “Threats to the validity of mutation-based test assessment,” in Proceedings of the 25th International Symposium on Software Testing and Analysis, ISSTA 2016 , 2016, pp. 354–365. [Online]. Available: https://doi.org/10.1145/2931037.2931040
2016
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D. B. Brown, M. Vaughn, B. Liblit, and T. W. Reps, “The care and feeding of wild-caught mutants,” in Proceedings of the 2017 11th Joint Meeting on Foundations of Software Engineering, ESEC/FSE 2017 . ACM, 2017, pp. 511–522. [Online]. Available: https://doi.org/10.1145/3106237.3106280
2017
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2012
Cited alongside, same era.
G. Fraser and A. Arcuri, “Whole test suite generation,” IEEE Trans. Software Eng. , vol. 39, no. 2, pp. 276–291, 2013. [Online]. Available: https://doi.org/10.1109/TSE.2012.14
2012
Cited alongside, same era.
R. K. Saha, M. Lease, S. Khurshid, and D. E. Perry, “Improving bug localization using structured information retrieval,” in Proceedings of the 28th IEEE/ACM International Conference on Automated Software Engineering (ASE) , 2013, pp. 345–355
2013
Cited alongside, same era.
D. Kim, J. Nam, J. Song, and S. Kim, “Automatic patch generation learned from human-written patches,” in Proceedings of the 35th ICSE . IEEE, 2013, pp. 802–811
2013
Cited alongside, same era.
S. W. Thomas, M. Nagappan, D. Blostein, and A. E. Hassan, “The impact of classifier configuration and classifier combination on bug localization,” IEEE Trans. Software Eng. , vol. 39, no. 10, pp. 1427–1443, 2013. [Online]. Available: https://doi.org/10.1109/TSE.2013.27
2013
Cited alongside, same era.
S. Wang and D. Lo, “Version History, Similar Report, and Structure: Putting Them Together for Improved Bug Localization,” in Proceedings of the 22nd International Conference on Program Comprehension (ICPC) , 2014, pp. 53–63
2014
Cited alongside, same era.
P. Ammann, M. E. Delamaro, and J. Offutt, “Establishing theoretical minimal sets of mutants,” in 2014 IEEE Seventh International Conference on Software Testing, Verification and Validation . IEEE, 2014
2014
Cited alongside, same era.
C.-P. Wong, Y. Xiong, H. Zhang, D. Hao, L. Zhang, and H. Mei, “Boosting Bug-Report-Oriented Fault Localization with Segmentation and Stack-Trace Analysis,” in Proceedings of the 2014 IEEE International Conference on Software Maintenance and Evolution (ICSME) , 2014, pp. 181–190
2014
Cited alongside, same era.
S. Moon, Y. Kim, M. Kim, and S. Yoo, “Ask the mutants: Mutating faulty programs for fault localization,” in Seventh IEEE International Conference on Software Testing, Verification and Validation, ICST 2014 . IEEE Computer Society, 2014, pp. 153–162. [Online]. Available: https://doi.org/10.1109/ICST.2014.28
2014
Cited alongside, same era.
T. Laurent, M. Papadakis, M. Kintis, C. Henard, Y. L. Traon, and A. Ventresque, “Assessing and improving the mutation testing practice of pit,” in 2017 IEEE International Conference on Software Testing, Verification and Validation (ICST) , March 2017, pp. 430–435
2017
Later among the works it cites.
R. K. Saha, Y. Lyu, H. Yoshida, and M. R. Prasad, “Elixir: Effective object-oriented program repair,” in Proceedings of the 32nd IEEE/ACM International Conference on Automated Software Engineering (ASE) , 2017, pp. 648–659
2017
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T. Durieux, B. Cornu, L. Seinturier, and M. Monperrus, “Dynamic patch generation for null pointer exceptions using metaprogramming,” in Proceedings of the 24th SANER . IEEE, 2017, pp. 349–358
2017
Later among the works it cites.
T. T. Chekam, M. Papadakis, Y. L. Traon, and M. Harman, “An empirical study on mutation, statement and branch coverage fault revelation that avoids the unreliable clean program assumption,” in Proceedings of the 39th International Conference on Software Engineering, ICSE 2017 , 2017, pp. 597–608. [Online]. Available: https://doi.org/10.1109/ICSE.2017.61
2017
Later among the works it cites.
M. Papadakis, M. Kintis, J. Zhang, Y. Jia, Y. L. Traon, and M. Harman, “Chapter six - mutation testing advances: An analysis and survey,” Advances in Computers , vol. 112, pp. 275–378, 2019. [Online]. Available: https://doi.org/10.1016/bs.adcom.2018.03.015
2018
Later among the works it cites.
M. Papadakis, D. Shin, S. Yoo, and D. Bae, “Are mutation scores correlated with real fault detection?: a large scale empirical study on the relationship between mutants and real faults,” in Proceedings of the 40th International Conference on Software Engineering, ICSE 2018 , 2018, pp. 537–548. [Online]. Available: https://doi.org/10.1145/3180155.3180183
2018
Later among the works it cites.
M. Papadakis, T. T. Chekam, and Y. L. Traon, “Mutant quality indicators,” in 2018 IEEE International Conference on Software Testing, Verification and Validation Workshops, ICST Workshops, Västerås, Sweden, April 9-13, 2018 . IEEE Computer Society, 2018, pp. 32–39. [Online]. Available: http://doi.ieeecomputersociety.org/10.1109/ICSTW.2018.00025
2018
Later among the works it cites.
M. Kintis, M. Papadakis, A. Papadopoulos, E. Valvis, N. Malevris, and Y. L. Traon, “How effective are mutation testing tools? an empirical analysis of java mutation testing tools with manual analysis and real faults,” Empir. Softw. Eng. , vol. 23, no. 4, pp. 2426–2463, 2018. [Online]. Available: https://doi.org/10.1007/s10664-017-9582-5
2018
Later among the works it cites.
K. Liu, D. Kim, T. F. Bissyandé, S. Yoo, and Y. Le Traon, “Mining fix patterns for findbugs violations,” IEEE Transactions on Software Engineering , 2018
2018
Later among the works it cites.
J. Hua, M. Zhang, K. Wang, and S. Khurshid, “Towards practical program repair with on-demand candidate generation,” in Proceedings of the 40th International Conference on Software Engineering (ICSE) , 2018, pp. 12–23
2018
Later among the works it cites.
M. Martinez and M. Monperrus, “Ultra-large repair search space with automatically mined templates: The cardumen mode of astor,” in Proceedings of the 10th SSBSE . Springer, 2018, pp. 65–86
2018
Later among the works it cites.
K. Liu, D. Kim, T. F. Bissyandé, S. Yoo, and Y. Le Traon, “Mining fix patterns for findbugs violations,” TSE , 2018
2018
Later among the works it cites.
M. Marcozzi, S. Bardin, N. Kosmatov, M. Papadakis, V. Prevosto, and L. Correnson, “Time to clean your test objectives,” in Proceedings of the 40th International Conference on Software Engineering, ICSE 2018, Gothenburg, Sweden, May 27 - June 03, 2018 , M. Chaudron, I. Crnkovic, M. Chechik, and M. Harman, Eds. ACM, 2018, pp. 456–467. [Online]. Available: https://doi.org/10.1145/3180155.3180191
2018
Later among the works it cites.
M. Tufano, C. Watson, G. Bavota, M. D. Penta, M. White, and D. Poshyvanyk, “Learning how to mutate source code from bug-fixes,” in 2019 IEEE International Conference on Software Maintenance and Evolution, ICSME 2019 . IEEE, 2019, pp. 301–312. [Online]. Available: https://doi.org/10.1109/ICSME.2019.00046
2019
Later among the works it cites.
A. Koyuncu, K. Liu, T. F. Bissyandé, D. Kim, M. Monperrus, J. Klein, and Y. L. Traon, “iFixR: Bug report driven program repair,” in Proceedings of the 13th Joint Meeting on Foundations of Software Engineering (FSE) , 2019
2019
Later among the works it cites.
C. L. Goues, M. Pradel, and A. Roychoudhury, “Automated program repair,” Commun. ACM , vol. 62, no. 12, pp. 56–65, 2019. [Online]. Available: https://doi.org/10.1145/3318162
2019
Later among the works it cites.
A. Koyuncu, K. Liu, T. F. Bissyandé, D. Kim, J. Klein, M. Monperrus, and Y. Le Traon, “Fixminer: Mining relevant fix patterns for automated program repair,” Empirical Software Engineering , October 2019
2019
Later among the works it cites.
K. Liu, A. Koyuncu, D. Kim, and T. F. Bissyandé, “Avatar: Fixing semantic bugs with fix patterns of static analysis violations,” in Proceedings of the IEEE 26th International Conference on Software Analysis, Evolution and Reengineering (SANER) , 2019, pp. 1–12
2019
Later among the works it cites.
K. Liu, A. Koyuncu, D. Kim, and T. F. Bissyandé, “TBar: Revisiting template-based automated program repair,” in Proceedings of the 28th ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA) , 2019, pp. 31–42
2019
Later among the works it cites.
T. T. Chekam, M. Papadakis, T. F. Bissyandé, Y. L. Traon, and K. Sen, “Selecting fault revealing mutants,” Empirical Software Engineering , vol. 25, no. 1, pp. 434–487, 2020. [Online]. Available: https://doi.org/10.1007/s10664-019-09778-7
2020
Closest in time.
Y. Lou, A. Ghanbari, X. Li, L. Zhang, H. Zhang, D. Hao, and L. Zhang, “Can automated program repair refine fault localization? a unified debugging approach,” in ISSTA ’20: 29th ACM SIGSOFT International Symposium on Software Testing and Analysis, Virtual Event, USA, July 18-22, 2020 . ACM, 2020, pp. 75–87. [Online]. Available: https://doi.org/10.1145/3395363.3397351
2020
Closest in time.