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Gaia: focus, straylight and basic angle · Around

2016

Gaia: focus, straylight and basic angle

Mora, A., Biermann, M., Bombrun, A. et al.

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The Gaia all-sky astrometric survey is challenged by several issues affecting the spacecraft stability.

Amongst them, we find the focus evolution, straylight and basic angle variations Contrary to pre-launch expectations, the image quality is continuously evolving, during commissioning and the nominal mission.
Payload decontaminations and wavefront sensor assisted refocuses have been carried out to recover optimum performance.
Straylight and basic angle variations several orders of magnitude greater than foreseen were found and studied during commissioning by the Gaia scientists (payload experts).

Built on

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Vosteen, L. L. A., Draaisma, F., van Werkhoven, W. P., van Riel, L. J. M., Mol, M. H., and den Ouden, G., “Wavefront sensor for the ESA-GAIA mission,” in [ Astronomical and Space Optical Systems
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Lindegren, L. and Bastian, U., “Basic principles of scanning space astrometry,” in [ EAS Publications Series
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Earlier work this paper cites.

Similar

Mora, A. and Vosteen, A., “Gaia in-orbit realignment: overview and data analysis,” in [ Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series
2012
Cited alongside, same era.
Amaro-Seoane, P., Aoudia, S., Babak, S., Binétruy, P., Berti, E., Bohé, A., Caprini, C., Colpi, M., Cornish, N. J., Danzmann, K., Dufaux, J.-F., Gair, J., Hinder, I., Jennrich, O., Jetzer, P., Klein, A., Lang, R. N., Lobo, A., Littenberg, T., McWilliams, S. T., Nelemans, G., Petiteau, A., Porter, E. K., Schutz, B. F., Sesana, A., Stebbins, R., Sumner, T., Vallisneri, M., Vitale, S., Volonteri, M., Ward, H., and Wardell, B., “eLISA: Astrophysics and cosmology in the millihertz regime,” GW Notes, Vol. 6, p. 4-110
Original
2013
Cited alongside, same era.

Then

Prusti, T., “Gaia Mission Status,” in [ EAS Publications Series
2014
Later among the works it cites.
Mora, A., Biermann, M., Brown, A. G. A., Busonero, D., Carminati, L., Carrasco, J. M., Chassat, F., Erdmann, M., Gielesen, W. L. M., Jordi, C., Katz, D., Kohley, R., Lindegren, L., Loeffler, W., Marchal, O., Panuzzo, P., Seabroke, G., Sahlmann, J., Serpell, E., Serraller, I., van Leeuwen, F., van Reeven, W., van den Dool, T. C., and Vosteen, L. L. A., “Gaia on-board metrology: basic angle and best focus,” in [ Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series
2014
Later among the works it cites.

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