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Thick, fully depleted p-channel charge-coupled devices (CCDs) have been developed at the Lawrence Berkeley National Laboratory (LBNL).
J. Janesick, G. Soli, T. Elliot, and S. Collins, “The effects of proton damage on charge-coupled devices”, Charge-Coupled Devices and Solid State Optical Sensors II, SPIE, 1447, 87, 1991
1991
Earlier work this paper cites.
J.P. Spratt, B. C. Passenheim,R. E. Leadon,“The Effects of Nuclear Radiation on p-channel CCD Imagers,” in 1997 IEEE Radiation Effects Data Workshop, NSREC Snowmass
1997
Earlier work this paper cites.
G.R. Hopkinson,“Proton Damage Effects on p-channel CCDs,” IEEE Trans. Nucl. Sci. 46(6), pp.1790-1796, 1999
1999
Earlier work this paper cites.
M. A. Xapsos, J. L. Barth, E. G. Stassinopoulos, E. A. Burke and G. B. Gee, “Space Environment Effects Model for Emission of Solar Protons (ESP) Cumulative and Worst Case Event Fluences”, NASA/TP-1999-209763, 1999
1999
Earlier work this paper cites.
J.Janesick, “Scientific Charge-Coupled Devices,” SPIE Press, 2001
2001
Earlier work this paper cites.
C. J. Bebek, D. E. Groom, S. E. Holland, A. Karchar, W. F. Kolbe, M. E. Levi, N. P. Palaio, B. T. Turko, M. C. Uslenghi, M. T. Wagner, and G. Wang, “Proton radiation damage in high-resistivity n-type silicon CCDs”, SPIE 4669, 161-171, 2002
2002
Earlier work this paper cites.
S. E. Holland, D. E. Groom, N. P. Palaio, R. J. Stover, and M. Wei, “Fully depleted, back-illuminated charge-coupled devices fabricated on high-resistivity silicon,” IEEE Trans. Elec. Dev., 50, 225, 2003
2003
Earlier work this paper cites.
I. Jun, M. A. Xapsos, S. R. Messenger, E. A. Burke, R. J. Walters, G. P. Summers, and T. Jordan, “Proton nonionizing energy loss (NIEL) for device applications”, NSS-IEEE, 50, 1924, 2003
2003
Cited alongside, same era.
G. Aldering et al., “Supernova / Acceleration Probe: A Satellite Experiment to Study the Nature of the Dark Energy”, astro-ph/0405232, 2004
2004
Cited alongside, same era.
C. Marshall, P .W. Marshall, A. Waczynski, E. Polidan, S. J. Johnson, and A. Campbell, “Comparisons of the proton-induced dark current and charge transfer efficiency responses of n- and p-channel CCDs”, SPIE, 5499, 542, 2004
2004
Cited alongside, same era.
A.Riess and J.Mack, “Time Dependence of ACS WFC CTE Corrections for Photometry and Future Predictions,” Instrument Science Report ACS 2004-006, 2004
2004
Cited alongside, same era.
M. Sirianni, M. J. Jee, N. Benítez, J. P. Blakeslee, A. R. Martel, G. Meurer, M. Clampin, G. De Marchi, H. C. Ford, R. Gilliland, G. F. Hartig, G. D. Illingworth, J. Mack, and W. J. McCann, “The Photometric Performance and Calibration of the Hubble Space Telescope Advanced Camera for Surveys,” PASP, 117, 836, 1049-1112, 2005
2005
Later among the works it cites.
M. Bautz, G. Prigozhin, S. Kissel, B. LaMarr, C. Grant, and S. Brown, “Anomalous annealing of a high-resistivity CCD irradiated at low temperature”, NSS-IEEE, 52, 519, 2005
2005
Later among the works it cites.
S. E. Holland, C. J. Bebek, K. S. Dawson, J. H. Emes, M. H. Fabricius, J. A. Fairfield, D. E. Groom, A. Karcher, W. F. Kolbe, N. P. Palaio, N. A. Roe, and G. Wang, “High-voltage-compatible, fully depleted CCD development”, SPIE, 6276, 10H, 2006
2006
Later among the works it cites.
D. E. Groom, C. J. Bebek, M. Fabricius, A. Karcher, W. F. Kolbe, N. A. Roe, and J. Steckert, “Quantum efficiency characterization of back-illuminated CCDs Part 1: The Quantum Efficiency Machine,”, SPIE, 6068, 2006
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E. J. Polidan, A. Waczynski, P. W. Marshall, S. J. Johnson, C. Marshall, R. Reed, R. A. Kimble, G. Delo, D. Schlossberg, A. M. Russell, T. Beck, Y. Wen, J. Yagelowich, R. J. Hill, and E. Wassell, “A study of hot pixel annealing in the Hubble Space Telescope Wide Field Camera 3 CCDs”, SPIE, 5167, 258, 2004
2004
Cited alongside, same era.
M. Sirianni, M. Mutchler, M. Clampin, H. C. Ford, G. D. Illingworth, G. F. Hartig, D. van Orsow and T. Wheeler, “Performance of the Advanced Camera for Surveys CCDs after two years on orbit”, SPIE, 5499, 173, 2004
2004
Cited alongside, same era.
J.P. Spratt, C. Conger, R. Bredthauer, W. Byers, R. Groulx, R. Leadon, and H. Clark, “Proton damage effects in high performance p-channel CCDs,” IEEE Trans. Nucl. Sci., 52, 2695, Dec. 2005
2005
Cited alongside, same era.
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Cited in the paper.
2006
Later among the works it cites.
M. H. Fabricius, C. J. Bebek, D. E. Groom, A. Karcher, and N. A. Roe, “Quantum efficiency characterization of back-illuminated CCDs Part 2: Reflectivity measurements”, SPIE, 6068, 2006
2006
Later among the works it cites.
2006
Later among the works it cites.
Holland, S. E., Dawson, K. S., Palaio, N. P., Saha J., Roe, N. A., and Wang, G., “Fabrication of Back-Illuminated, Fully Depleted Charge Coupled Devices”, NIM, 5, 265, 2007
2007
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