Assessing the quality of near-term photonic quantum devices

Understand

For near-term quantum devices, an important challenge is to develop efficient methods to certify that noise levels are low enough to allow potentially useful applications to be carried out.

• We present such a method tailored to photonic quantum devices consisting of single photon sources coupled to linear optical circuits coupled to photon detectors.
• It uses the output statistics of BosonSampling experiments with input size $n$ ($n$ input photons in the ideal case).
• We propose a series of benchmark tests targetting two main sources of noise, namely photon loss and distinguishability.