Entanglement negativity at the critical point of measurement-driven transition

Understand

We study the entanglement behavior of a random unitary circuit punctuated by projective measurements at the measurement-driven phase transition in one spatial dimension.

• We numerically study the logarithmic entanglement negativity of two disjoint intervals and find that it scales as a power of the cross-ratio.
• We investigate two systems: (1) Clifford circuits with projective measurements, and (2) Haar random local unitary circuit with projective measurements.
• Remarkably, we identify a power-law behavior of entanglement negativity at the critical point.