Improving Blind Spot Denoising for Microscopy

Understand

Many microscopy applications are limited by the total amount of usable light and are consequently challenged by the resulting levels of noise in the acquired images.

• This problem is often addressed via (supervised) deep learning based denoising.
• Recently, by making assumptions about the noise statistics, self-supervised methods have emerged.
• Such methods are trained directly on the images that are to be denoised and do not require additional paired training data.