Modeling Noisy Quantum Circuits Using Experimental Characterization

Understand

Noisy intermediate-scale quantum (NISQ) devices offer unique platforms to test and evaluate the behavior of non-fault-tolerant quantum computing.

• However, validating programs on NISQ devices is difficult due to fluctuations in the underlying noise sources and other non-reproducible behaviors that generate computational errors.
• Efficient and effective methods for modeling NISQ behaviors are necessary to debug these devices and develop programming techniques that mitigate against errors.
• We present a test-driven approach to characterizing NISQ programs that manages the complexity of noisy circuit modeling by decomposing an application-specific circuit into a series of bootstrapped experiments.