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We present a novel unsupervised deep learning approach that utilizes the encoder-decoder architecture for detecting anomalies in sequential sensor data collected during industrial manufacturing.
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Syed A.M. Tofail, Elias P. Koumoulos, Amit Bandyopadhyay, Susmita Bose, Lisa O’Donoghue, and C.A. Charitidis · 2017
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