Test of Ultra Fast Silicon Detectors for Picosecond Time Measurements with a New Multipurpose Read-Out Board

Understand

Ultra Fast Silicon Detectors (UFSD) are sensors optimized for timing measurements employing a thin multiplication layer to increase the output signal.

• A multipurpose read-out board hosting a low-cost, low-power fast amplifier was designed at the University of Kansas and tested at the European Organization for Nuclear Research (CERN) using a 180 GeV pion beam.
• The amplifier has been designed to read out a wide range of detectors and it was optimized in this test for the UFSD output signal.
• In this paper we report the results of the experimental tests using 50 $\rm{\mu m}$ thick UFSD with a sensitive area of 1.4 $\rm{mm^2}$.