INTEGRAL/SPI data segmentation to retrieve source intensity variations

Understand

The INTEGRAL/SPI, X-gamma-ray spectrometer (20 keV - 8 MeV) is an instrument for which recovering source intensity variations is not straightforward and can constitute a difficulty for data analysis.

• In most cases, determining the source intensity changes between exposures is largely based on a priori information.
• We propose techniques that help to overcome the difficulty related to source intensity variations, which make this step more rational.
• In addition, the constructed "synthetic" light curves should permit us to obtain a sky model that describes the data better and optimizes the source signal-to-noise ratios.