2008

Randomized benchmarking and process tomography for gate errors in a solid-state qubit

Chow, J. M., Gambetta, J. M., Tornberg, L. et al.

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We present measurements of single-qubit gate errors for a superconducting qubit.

  • Results from quantum process tomography and randomized benchmarking are compared with gate errors obtained from a double pi pulse experiment.
  • Randomized benchmarking reveals a minimum average gate error of 1.1+/-0.3% and a simple exponential dependence of fidelity on the number of gates.
  • It shows that the limits on gate fidelity are primarily imposed by qubit decoherence, in agreement with theory.

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