Understand
We describe a method for computing the biases that systematic signals introduce in parameter estimation using a simple extension of the Fisher matrix formalism.
- This allows us to calculate the offset of the best fit parameters relative to the fiducial model, in addition to the usual statistical error ellipse.
- As an application, we study the impact that residual systematics in tomographic weak lensing measurements.
- In particular we explore three different types of shape measurement systematics: (i) additive systematic with no redshift evolution; (ii) additive systematic with redshift evolution; and (iii) multiplicative systematic.
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MNRAS 270
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ArXiv Astrophysics e-prints
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ARA&A 41
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Heymans, C., Van Waerbeke, L., Bacon, D., Berge, J., Bernstein, G., Bertin, E., Bridle, S., Brown, M. L., Clowe, D., Dahle, H., Erben, T., Gray, M., Hetterscheidt, M., Hoekstra, H., Hudelot, P., Jarvis, M., Kuijken, K., Margoniner, V., Massey, R., Mellier, Y., Nakajima, R., Refregier, A., Rhodes, J., Schrabback, T., and Wittman, D.: 2006, · 2006
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ArXiv Astrophysics e-prints
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Benjamin, J., Heymans, C., Semboloni, E., van Waerbeke, L., Hoekstra, H., Erben, T., Gladders, M. D., Hetterscheidt, M., Mellier, Y., and Yee, H. K. C.: 2007, · 2007
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MNRAS 376
Massey, R., Heymans, C., Bergé, J., Bernstein, G., Bridle, S., Clowe, D., Dahle, H., Ellis, R., Erben, T., Hetterscheidt, M., High, F. W., Hirata, C., Hoekstra, H., Hudelot, P., Jarvis, M., Johnston, D., Kuijken, K., Margoniner, V., Mandelbaum, R., Mellier, Y., Nakajima, R., Paulin-Henriksson, S., Peeples, M., Roat, C., Refregier, A., Rhodes, J., Schrabback, T., Schirmer, M., Seljak, U., Semboloni, E., and van Waerbeke, L.: 2007, · 2007
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